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1 Ergebnisse
1
Addressing Single-Event-Multiple-Transient Faults in Asynch..:
, In:
2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI)
,
Kuentzer, Felipe A.
;
Georgakidis, Christos
;
Sotiriou, Christos
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/SBCCI60457.2023.10261666
RT T1 <cTitle>2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI)</cTitle>: T1 <Title>Addressing Single-Event-Multiple-Transient Faults in Asynchronous RH-Click Controllers</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10261666&Exemplar=1&LAN=DE A1 Kuentzer, Felipe A. A1 Georgakidis, Christos A1 Sotiriou, Christos A1 Krstic, Milos YR 2023 K1 Radiation effects K1 Radiation hardening (electronics) K1 Aerospace electronics K1 Very large scale integration K1 Reliability engineering K1 Robustness K1 Behavioral sciences K1 Asynchronous Design K1 SEMT K1 Click Controller K1 Placement K1 Soft Errors K1 Radiation Hardening K1 Reliability SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/SBCCI60457.2023.10261666 DO https://doi.org/10.1109/SBCCI60457.2023.10261666 SF ELIB - SuUB Bremen
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