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Cause Analysis of an Internal Short Circuit Grounding Fault..:

, In: 2023 3rd International Conference on Electrical Engineering and Mechatronics Technology (ICEEMT),
Zhang, Tianbo ; Lin, Haofan ; He, Jian. - p. 856-860 , 2023
Link: https://doi.org/10.1109/ICEEMT59522.2023.10263193