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Design of Digital Circuit Boundary Scan Test Controller Bas..:

, In: 2023 IEEE International Conference on Sensors, Electronics and Computer Engineering (ICSECE),
Yin, Tingwei ; Zhang, Xiaozheng ; Wang, Yanyong. - p. 287-291 , 2023
Link: https://doi.org/10.1109/ICSECE58870.2023.10263284