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1 Ergebnisse
1
Design of Digital Circuit Boundary Scan Test Controller Bas..:
, In:
2023 IEEE International Conference on Sensors, Electronics and Computer Engineering (ICSECE)
,
Yin, Tingwei
;
Zhang, Xiaozheng
;
Wang, Yanyong
. - p. 287-291 , 2023
Link:
https://doi.org/10.1109/ICSECE58870.2023.10263284
RT T1
2023 IEEE International Conference on Sensors, Electronics and Computer Engineering (ICSECE)
: T1
Design of Digital Circuit Boundary Scan Test Controller Based on Embedded Platform
UL https://suche.suub.uni-bremen.de/peid=ieee-10263284&Exemplar=1&LAN=DE A1 Yin, Tingwei A1 Zhang, Xiaozheng A1 Wang, Yanyong A1 Ren, Xuebing YR 2023 K1 Technological innovation K1 Software design K1 Fault detection K1 Welding K1 Digital integrated circuits K1 Maintenance engineering K1 Electrical fault detection K1 Digital integrated circuit K1 boundary scan testing K1 embedded platform K1 fault diagnosis SP 287 OP 291 LK http://dx.doi.org/https://doi.org/10.1109/ICSECE58870.2023.10263284 DO https://doi.org/10.1109/ICSECE58870.2023.10263284 SF ELIB - SuUB Bremen
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