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1
Reliability of WBG, results of a Pre-Scoping Study:
, In:
2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
,
Zhang, Kaichen
;
Iannuzzo, Francesco
;
Christiansen, Christian Holm
- p. 1-7 , 2023
Link:
https://doi.org/10.23919/EPE23ECCEEurope58414.2023.102..
RT T1 <cTitle>2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)</cTitle>: T1 <Title>Reliability of WBG, results of a Pre-Scoping Study</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10264334&Exemplar=1&LAN=DE A1 Zhang, Kaichen A1 Iannuzzo, Francesco A1 Christiansen, Christian Holm YR 2023 K1 Power measurement K1 Photonic band gap K1 Europe K1 Focusing K1 Failure analysis K1 Market research K1 Power electronics K1 Wide bandgap K1 Reliability K1 Silicon Carbide (SiC) K1 Gallium Nitride (GaN) K1 Device application SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264334 DO https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264334 SF ELIB - SuUB Bremen
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