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1 Ergebnisse
1
Fully Automated Wide Temperature Range Semiconductor Charac..:
, In:
2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
,
Frank, S. R.
;
Hansel, J.
;
Bitterle, J.
.. - p. 1-9 , 2023
Link:
https://doi.org/10.23919/EPE23ECCEEurope58414.2023.102..
RT T1 <cTitle>2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)</cTitle>: T1 <Title>Fully Automated Wide Temperature Range Semiconductor Characterization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10264384&Exemplar=1&LAN=DE A1 Frank, S. R. A1 Hansel, J. A1 Bitterle, J. A1 Schwendemann, R. A1 Hiller, M. YR 2023 K1 Temperature measurement K1 Insulated gate bipolar transistors K1 Temperature distribution K1 Semiconductor device measurement K1 Breakdown voltage K1 Voltage measurement K1 Semiconductor materials K1 IGBT K1 SiC MOSFET K1 Semiconductor device K1 I-V signature K1 Test bench K1 Double pulse test SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264384 DO https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264384 SF ELIB - SuUB Bremen
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