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1 Ergebnisse
1
Temperature Monitoring of Multi-Chip SiC MOSFET Modules: On..:
, In:
2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
,
Baker, Nick
;
Lemmon, Andy
;
Iannuzzo, Francesco
... - p. 1-9 , 2023
Link:
https://doi.org/10.23919/EPE23ECCEEurope58414.2023.102..
RT T1 <cTitle>2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)</cTitle>: T1 <Title>Temperature Monitoring of Multi-Chip SiC MOSFET Modules: On-Chip RTDs vs. VSD(T)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10264420&Exemplar=1&LAN=DE A1 Baker, Nick A1 Lemmon, Andy A1 Iannuzzo, Francesco A1 Beczkowski, Szymon A1 Austin, John A1 Ostrander, Lauren YR 2023 K1 Temperature measurement K1 Temperature sensors K1 Insulated gate bipolar transistors K1 Semiconductor device measurement K1 Temperature distribution K1 MOSFET K1 Silicon carbide K1 Junction Temperature K1 Junction Temperature Measurement K1 Junction Temperature Estimation K1 SiC MOSFET K1 IGBT SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264420 DO https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264420 SF ELIB - SuUB Bremen
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