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1 Ergebnisse
1
An Active Gate Driver for Iteratively Optimizing the Switch..:
, In:
2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
,
Kuhn, Johannes
;
Zekorn, Tobias
;
Vohl, Kenny
.. - p. 1-8 , 2023
Link:
https://doi.org/10.23919/EPE23ECCEEurope58414.2023.102..
RT T1 <cTitle>2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)</cTitle>: T1 <Title>An Active Gate Driver for Iteratively Optimizing the Switching Characteristics of SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10264429&Exemplar=1&LAN=DE A1 Kuhn, Johannes A1 Zekorn, Tobias A1 Vohl, Kenny A1 Wunderlich, Ralf A1 Heinen, Stefan YR 2023 K1 MOSFET K1 Silicon carbide K1 Current measurement K1 Europe K1 Switches K1 Logic gates K1 Gate drivers K1 Smart gate drivers K1 Intelligent gate driver K1 EMC/EMI K1 SiC MOSFET SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264429 DO https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264429 SF ELIB - SuUB Bremen
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