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1 Ergebnisse
1
Deadtime optimization eliminating snap-off of 3.3kV SiC MOS..:
, In:
2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
,
Marz, Andreas
;
Schonewolf, Stefan
;
Nagel, Andreas
.. - p. 1-7 , 2023
Link:
https://doi.org/10.23919/EPE23ECCEEurope58414.2023.102..
RT T1 <cTitle>2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)</cTitle>: T1 <Title>Deadtime optimization eliminating snap-off of 3.3kV SiC MOSFET bodydiodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10264563&Exemplar=1&LAN=DE A1 Marz, Andreas A1 Schonewolf, Stefan A1 Nagel, Andreas A1 Rauh, Michael A1 Bakran, Mark-M. YR 2023 K1 MOSFET K1 Schottky diodes K1 Silicon carbide K1 Switching loss K1 Europe K1 Switches K1 Semiconductor device manufacture K1 Silicon Carbide (SiC) K1 SiC MOSFET K1 Diode K1 Schottky diode K1 Traction application SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264563 DO https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264563 SF ELIB - SuUB Bremen
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