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1 Ergebnisse
1
Online Threshold Voltage Monitoring at SiC Power Devices du..:
, In:
2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
,
Heimler, Patrick
;
Alaluss, Mohamed
;
Schwabe, Christian
... - p. 1-10 , 2023
Link:
https://doi.org/10.23919/EPE23ECCEEurope58414.2023.102..
RT T1 <cTitle>2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)</cTitle>: T1 <Title>Online Threshold Voltage Monitoring at SiC Power Devices during Power Cycling Test and Possible Consequences</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10264579&Exemplar=1&LAN=DE A1 Heimler, Patrick A1 Alaluss, Mohamed A1 Schwabe, Christian A1 Liu, Xing A1 Lutz, Josef A1 Basler, Thomas YR 2023 K1 Temperature measurement K1 Degradation K1 Temperature dependence K1 Voltage measurement K1 Power measurement K1 Wires K1 Europe K1 «Power Cycling» K1 «SiC MOSFET» K1 «Discrete Power Device» K1 «Reliability» K1 «Threshold voltage instability» K1 «Threshold voltage shift» SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264579 DO https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264579 SF ELIB - SuUB Bremen
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