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1
Static and Dynamic Characterization of a 1.2 kV SiC MOSFET ..:
, In:
2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
,
Masson, Matthieu
;
Cousineau, Marc
;
Rouger, Nicolas
. - p. 1-8 , 2023
Link:
https://doi.org/10.23919/EPE23ECCEEurope58414.2023.102..
RT T1 <cTitle>2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)</cTitle>: T1 <Title>Static and Dynamic Characterization of a 1.2 kV SiC MOSFET in Third Quadrant</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10264635&Exemplar=1&LAN=DE A1 Masson, Matthieu A1 Cousineau, Marc A1 Rouger, Nicolas A1 Richardeau, Frederic YR 2023 K1 Semiconductor device modeling K1 Performance evaluation K1 Rails K1 MOSFET K1 Silicon carbide K1 Europe K1 Logic gates K1 SiC MOSFET K1 Device characterisation K1 Experimental testing K1 Double pulse test K1 DC-DC power converter SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264635 DO https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264635 SF ELIB - SuUB Bremen
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