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SEU and SEFI Characterization of a Frontgrade QCOTS 512Gb N..:

, In: 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC),
Nelson, Peter ; Von Thun, Matt ; Turnbull, Aaron.. - p. 1-9 , 2023
Link: https://doi.org/10.1109/REDW61050.2023.10265820