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1 Ergebnisse
1
Neutron Induced Single Event Testing of Commercial Ferroele..:
, In:
2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC)
,
Deaton., Terrence F.
;
Tostanoski, Michael J.
;
Peters, Michael K.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/REDW61050.2023.10265825
RT T1 <cTitle>2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC)</cTitle>: T1 <Title>Neutron Induced Single Event Testing of Commercial Ferroelectric Memory Device (FRAM)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10265825&Exemplar=1&LAN=DE A1 Deaton., Terrence F. A1 Tostanoski, Michael J. A1 Peters, Michael K. A1 Hartojo, Kristianto A1 Lachiewicz, Gerard A1 Fullem, Travis Z. YR 2023 SN 2154-0535 K1 Radiation effects K1 Nonvolatile memory K1 Ferroelectric films K1 Error analysis K1 Conferences K1 Single event upsets K1 Random access memory K1 neutron induced upset (NIU) K1 radiation effects K1 single event effects (SEE) K1 single event functional interrupt (SEFI) K1 single event upset (SEU) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/REDW61050.2023.10265825 DO https://doi.org/10.1109/REDW61050.2023.10265825 SF ELIB - SuUB Bremen
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