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1 Ergebnisse
1
Single Event Effects and TID Characterization of the Frontg..:
, In:
2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC)
,
Von Thun, Matt
;
Baranski, Brian
;
Turnbull, Aaron
.. - p. 1-7 , 2023
Link:
https://doi.org/10.1109/REDW61050.2023.10265839
RT T1
2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC)
: T1
Single Event Effects and TID Characterization of the Frontgrade Technologies UT24C407 Certus™-NX-RT FPGA for Space Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-10265839&Exemplar=1&LAN=DE A1 Von Thun, Matt A1 Baranski, Brian A1 Turnbull, Aaron A1 Berg, Melanie A1 Linton, Scott YR 2023 SN 2154-0535 K1 Space vehicles K1 Performance evaluation K1 Error analysis K1 Single event upsets K1 Materials handling K1 Logic gates K1 Ions SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/REDW61050.2023.10265839 DO https://doi.org/10.1109/REDW61050.2023.10265839 SF ELIB - SuUB Bremen
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