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1 Ergebnisse
1
NPN Si/SiGe memory selector with non-linearity>105 and ON-c..:
, In:
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)
,
Hiblot, Gaspard
;
Ravsher, Taras
;
Loo, Roger
... - p. 164-167 , 2023
Link:
https://doi.org/10.1109/ESSDERC59256.2023.10268470
RT T1 <cTitle>ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)</cTitle>: T1 <Title>NPN Si/SiGe memory selector with non-linearity>105 and ON-current>6MA/cm2</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10268470&Exemplar=1&LAN=DE A1 Hiblot, Gaspard A1 Ravsher, Taras A1 Loo, Roger A1 Ramana, Bhuvaneshwari Yengula Venkata A1 Vergel, Nathali Franchina A1 Fantini, Andrea A1 Sharifi, Shamin Houshmand A1 Bazzazian, Nina A1 Wostyn, Kurt A1 Labbate, Loris Angelo A1 Couet, Sebastien A1 Kar, Gouri Sankar YR 2023 SN 2378-6558 K1 Pulse measurements K1 Europe K1 Heterojunctions K1 Germanium K1 Ions K1 Delays K1 Reliability K1 NPN K1 memory selector K1 latch-up SP 164 OP 167 LK http://dx.doi.org/https://doi.org/10.1109/ESSDERC59256.2023.10268470 DO https://doi.org/10.1109/ESSDERC59256.2023.10268470 SF ELIB - SuUB Bremen
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