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STT-MRAM Stochastic and Defects-aware DTCO for Last Level C..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Garcia-Redondo, F. ; Rao, S. ; Gupta, M.... - p. 97-100 , 2023
Link: https://doi.org/10.1109/ESSDERC59256.2023.10268481