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Characterization and Modeling of High Voltage MOS Robustnes..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Basso, Michele ; Sambi, Marco ; Marcovati, Andrea - p. 156-159 , 2023
Link: https://doi.org/10.1109/ESSDERC59256.2023.10268485