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1 Ergebnisse
1
ePCM reliability improvement through active material carbon..:
, In:
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)
,
Palumbo, Elisabetta
;
Motta, Alessandro
;
Petroni, Elisa
... - p. 29-32 , 2023
Link:
https://doi.org/10.1109/ESSDERC59256.2023.10268520
RT T1 <cTitle>ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)</cTitle>: T1 <Title>ePCM reliability improvement through active material carbon implantation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10268520&Exemplar=1&LAN=DE A1 Palumbo, Elisabetta A1 Motta, Alessandro A1 Petroni, Elisa A1 Gallinari, Daniele A1 Gilardini, Annalisa A1 Galbiati, Amos A1 Borghi, Massimo A1 Annunziata, Roberto A1 Redaelli, Andrea YR 2023 SN 2378-6558 K1 Phase change materials K1 Temperature distribution K1 Chemical analysis K1 Semiconductor device reliability K1 Materials reliability K1 Germanium K1 Phase change memory K1 Phase-Change K1 ePCM K1 Ge-rich GST K1 Ge segregation K1 carbon implantation K1 doping K1 retention K1 endurance K1 reliability SP 29 OP 32 LK http://dx.doi.org/https://doi.org/10.1109/ESSDERC59256.2023.10268520 DO https://doi.org/10.1109/ESSDERC59256.2023.10268520 SF ELIB - SuUB Bremen
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