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1 Ergebnisse
1
Complete Reconfigurable Boolean Logic Gates Based on One Fe..:
, In:
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)
,
Zeng, Yiqin
;
Ding, Zhetao
;
Li, Xueyang
... - p. 85-88 , 2023
Link:
https://doi.org/10.1109/ESSDERC59256.2023.10268548
RT T1 <cTitle>ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)</cTitle>: T1 <Title>Complete Reconfigurable Boolean Logic Gates Based on One FeFET -One RRAM Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10268548&Exemplar=1&LAN=DE A1 Zeng, Yiqin A1 Ding, Zhetao A1 Li, Xueyang A1 Ma, Minglei A1 Peng, Yue A1 Shen, Rongzong A1 Lin, Gaobo A1 Jin, Chengji A1 Yu, Xiao A1 Chen, Bing A1 Cheng, Ran A1 Han, Genquan YR 2023 SN 2378-6558 K1 Resistance K1 Performance evaluation K1 Logic circuits K1 Europe K1 Electric variables measurement K1 Logic gates K1 Logic functions K1 1FeFET1R K1 Complete Boolean logic K1 TCAD SP 85 OP 88 LK http://dx.doi.org/https://doi.org/10.1109/ESSDERC59256.2023.10268548 DO https://doi.org/10.1109/ESSDERC59256.2023.10268548 SF ELIB - SuUB Bremen
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