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1 Ergebnisse
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AFE-CIM: A Current-Domain Compute-In-Memory Macro for Analo..:
, In:
ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)
,
Sharma, Sudarshan
;
Wang, Wei-Chun
;
DeLude, Coleman
... - p. 33-36 , 2023
Link:
https://doi.org/10.1109/ESSCIRC59616.2023.10268706
RT T1 <cTitle>ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)</cTitle>: T1 <Title>AFE-CIM: A Current-Domain Compute-In-Memory Macro for Analog-to-Feature Extraction</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10268706&Exemplar=1&LAN=DE A1 Sharma, Sudarshan A1 Wang, Wei-Chun A1 DeLude, Coleman A1 Lee, Minah A1 Rahman, Nael Mizanur A1 Kidambi, Narasimha Vasishta A1 Romberg, Justin A1 Mukhopadhyay, Saibal YR 2023 SN 2643-1319 K1 Radio frequency K1 Semiconductor device measurement K1 Random access memory K1 Prototypes K1 Solid state circuit design K1 Feature extraction K1 Throughput K1 Analog-to-Feature Extraction K1 Computing-In-Memory (CIM) K1 Mixed-signal Design K1 SRAM SP 33 OP 36 LK http://dx.doi.org/https://doi.org/10.1109/ESSCIRC59616.2023.10268706 DO https://doi.org/10.1109/ESSCIRC59616.2023.10268706 SF ELIB - SuUB Bremen
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