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On the Noise Contribution of Dielectric Interfaces in Bioch..:
, In:
ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)
,
Schulz, Mathias
;
Keil, Stefan
;
Lohlein, Simon
... - p. 149-152 , 2023
Link:
https://doi.org/10.1109/ESSCIRC59616.2023.10268761
RT T1 <cTitle>ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)</cTitle>: T1 <Title>On the Noise Contribution of Dielectric Interfaces in Biochemical CMOS Sensor Chips</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10268761&Exemplar=1&LAN=DE A1 Schulz, Mathias A1 Keil, Stefan A1 Lohlein, Simon A1 Banerjee, Sourish A1 Simon, Nicolai A1 Dubourdieu, Catherine A1 Bucher, Volker A1 Thewes, Roland YR 2023 SN 2643-1319 K1 Semiconductor device modeling K1 Shape K1 Biological system modeling K1 Europe K1 Mathematical models K1 Dielectrics K1 Low-frequency noise K1 1/f noise K1 flicker noise K1 ISFET K1 EOSFET K1 sensor dielectric K1 electrolyte K1 CMOS SP 149 OP 152 LK http://dx.doi.org/https://doi.org/10.1109/ESSCIRC59616.2023.10268761 DO https://doi.org/10.1109/ESSCIRC59616.2023.10268761 SF ELIB - SuUB Bremen
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