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1 Ergebnisse
1
PCB Defect Detection Algorithm of Improved YOLOv8:
, In:
2023 8th International Conference on Image, Vision and Computing (ICIVC)
,
Lan, Hong
;
Zhu, Huasheng
;
Luo, Rui
.. - p. 178-183 , 2023
Link:
https://doi.org/10.1109/ICIVC58118.2023.10270049
RT T1
2023 8th International Conference on Image, Vision and Computing (ICIVC)
: T1
PCB Defect Detection Algorithm of Improved YOLOv8
UL https://suche.suub.uni-bremen.de/peid=ieee-10270049&Exemplar=1&LAN=DE A1 Lan, Hong A1 Zhu, Huasheng A1 Luo, Rui A1 Ren, Qiaofeng A1 Chen, Cong YR 2023 K1 Training K1 Industries K1 Deep learning K1 Computational modeling K1 Production K1 Feature extraction K1 Neck K1 YOLOv8 K1 PCB defect detection K1 small target detection K1 a cross-scale feature fusion module SP 178 OP 183 LK http://dx.doi.org/https://doi.org/10.1109/ICIVC58118.2023.10270049 DO https://doi.org/10.1109/ICIVC58118.2023.10270049 SF ELIB - SuUB Bremen
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