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1 Ergebnisse
1
Indirect Testing of Specifications in Analog Integrated Cir..:
, In:
2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)
,
Cao, Jiawei
;
Wang, Zhigang
;
Li, Hao
... - p. 1-7 , 2023
Link:
https://doi.org/10.1109/ICEMI59194.2023.10270266
RT T1 <cTitle>2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)</cTitle>: T1 <Title>Indirect Testing of Specifications in Analog Integrated Circuits Based on Black-Box Modeling</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10270266&Exemplar=1&LAN=DE A1 Cao, Jiawei A1 Wang, Zhigang A1 Li, Hao A1 Wang, Houjun A1 Wei, Yangbin A1 Luo, Guangkun YR 2023 K1 Costs K1 Instruments K1 Fitting K1 Closed box K1 Prediction algorithms K1 Integrated circuit modeling K1 Standards K1 integrated circuit testing K1 modeling K1 black box K1 indirect test SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/ICEMI59194.2023.10270266 DO https://doi.org/10.1109/ICEMI59194.2023.10270266 SF ELIB - SuUB Bremen
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