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1 Ergebnisse
1
High-Speed Signal Jitter Measurement Method Based on Bit Er..:
, In:
2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)
,
Yang, Wanyu
;
Tian, Shulin
;
Dai, Zhijian
- p. 71-77 , 2023
Link:
https://doi.org/10.1109/ICEMI59194.2023.10270301
RT T1
2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)
: T1
High-Speed Signal Jitter Measurement Method Based on Bit Error Rate Eye Diagram
UL https://suche.suub.uni-bremen.de/peid=ieee-10270301&Exemplar=1&LAN=DE A1 Yang, Wanyu A1 Tian, Shulin A1 Dai, Zhijian YR 2023 K1 Costs K1 Bit error rate K1 Oscilloscopes K1 Bandwidth K1 Jitter K1 Probability density function K1 Delays K1 high-speed serial signal K1 time jitter K1 bit error rate eye diagram SP 71 OP 77 LK http://dx.doi.org/https://doi.org/10.1109/ICEMI59194.2023.10270301 DO https://doi.org/10.1109/ICEMI59194.2023.10270301 SF ELIB - SuUB Bremen
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