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1 Ergebnisse
1
Fully-Adjustable Test Signal Generation Module with Multi-F..:
, In:
2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)
,
Gao, Shuaihao
;
Fu, Zaiming
;
Kong, Dexuan
.. - p. 1-9 , 2023
Link:
https://doi.org/10.1109/ICEMI59194.2023.10270486
RT T1
2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)
: T1
Fully-Adjustable Test Signal Generation Module with Multi-Functional Outputs
UL https://suche.suub.uni-bremen.de/peid=ieee-10270486&Exemplar=1&LAN=DE A1 Gao, Shuaihao A1 Fu, Zaiming A1 Kong, Dexuan A1 Zou, Lingwen A1 Zan, Liyu YR 2023 K1 Digital systems K1 Integrated circuit testing K1 Instruments K1 Signal generators K1 Hardware K1 Generators K1 Test equipment K1 signal generator K1 digital test K1 precision delay K1 signal conditioning SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/ICEMI59194.2023.10270486 DO https://doi.org/10.1109/ICEMI59194.2023.10270486 SF ELIB - SuUB Bremen
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