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1 Ergebnisse
1
Research on Self-Learning Flaw Detection in Ultrasonic C-Sc..:
, In:
2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)
,
Li, Zhipeng
;
Shi, Yibing
;
Li, Yanjun
.. - p. 401-405 , 2023
Link:
https://doi.org/10.1109/ICEMI59194.2023.10270734
RT T1 <cTitle>2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)</cTitle>: T1 <Title>Research on Self-Learning Flaw Detection in Ultrasonic C-Scan Non-Destructive Testing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10270734&Exemplar=1&LAN=DE A1 Li, Zhipeng A1 Shi, Yibing A1 Li, Yanjun A1 Zhang, Wei A1 Qiu, Ao YR 2023 K1 Fault diagnosis K1 Deep learning K1 Instruments K1 Corrosion K1 Pipelines K1 Feature extraction K1 Acoustics K1 ultrasonic NDT K1 C-scan K1 self-learning K1 semi-supervised learning K1 flaw classification SP 401 OP 405 LK http://dx.doi.org/https://doi.org/10.1109/ICEMI59194.2023.10270734 DO https://doi.org/10.1109/ICEMI59194.2023.10270734 SF ELIB - SuUB Bremen
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