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1 Ergebnisse
1
Addressing the electrical degradation of 845 nm micro-trans..:
, In:
2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
,
Zenari, M.
;
Buffolo, M.
;
De Santi, C.
... - p. 91-92 , 2023
Link:
https://doi.org/10.1109/NUSOD59562.2023.10273478
RT T1 <cTitle>2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)</cTitle>: T1 <Title>Addressing the electrical degradation of 845 nm micro-transfer printed VCSILs through TCAD simulations</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10273478&Exemplar=1&LAN=DE A1 Zenari, M. A1 Buffolo, M. A1 De Santi, C. A1 Goyvaerts, J. A1 Grabowski, A. A1 Gustavsson, J. A1 Baets, R. A1 Larsson, A. A1 Roelkens, G. A1 Meneghesso, G. A1 Zanoni, E. A1 Meneghini, M. YR 2023 SN 2158-3242 K1 Degradation K1 Resistance K1 Temperature sensors K1 Temperature measurement K1 Temperature K1 Impurities K1 Voltage K1 VCSIL K1 Silicon photonics K1 Diffusion SP 91 OP 92 LK http://dx.doi.org/https://doi.org/10.1109/NUSOD59562.2023.10273478 DO https://doi.org/10.1109/NUSOD59562.2023.10273478 SF ELIB - SuUB Bremen
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