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1 Ergebnisse
1
Modeling the electrical characteristic and degradation mech..:
, In:
2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
,
Roccato, Nicola
;
Piva, Francesco
;
De Santi, Carlo
... - p. 81-83 , 2023
Link:
https://doi.org/10.1109/NUSOD59562.2023.10273497
RT T1 <cTitle>2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)</cTitle>: T1 <Title>Modeling the electrical characteristic and degradation mechanisms of UV-C LEDs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10273497&Exemplar=1&LAN=DE A1 Roccato, Nicola A1 Piva, Francesco A1 De Santi, Carlo A1 Buffolo, Matteo A1 Susilo, Normal A1 Vidal, Daniel Hauer A1 Muhin, Anton A1 Sulmoni, Luca A1 Wernicke, Tim A1 Kneissl, Micheal A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Meneghini, Matteo YR 2023 SN 2158-3242 K1 Degradation K1 Voltage measurement K1 Electric variables K1 Numerical simulation K1 Light emitting diodes K1 Numerical models K1 Leakage currents K1 UV-C LED K1 Light-Emitting Diodes K1 simulations K1 Trap-Assisted Tunneling K1 contact K1 modeling SP 81 OP 83 LK http://dx.doi.org/https://doi.org/10.1109/NUSOD59562.2023.10273497 DO https://doi.org/10.1109/NUSOD59562.2023.10273497 SF ELIB - SuUB Bremen
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