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Estimation of Frequency Noise Characteristics and Data-Driv..:
, In:
2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
,
Kantner, Markus
;
Mertenskotter, Lutz
- p. 55-56 , 2023
Link:
https://doi.org/10.1109/NUSOD59562.2023.10273522
RT T1 <cTitle>2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)</cTitle>: T1 <Title>Estimation of Frequency Noise Characteristics and Data-Driven Modeling of Narrow-Linewidth Semiconductor Lasers</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10273522&Exemplar=1&LAN=DE A1 Kantner, Markus A1 Mertenskotter, Lutz YR 2023 SN 2158-3242 K1 Semiconductor device measurement K1 Semiconductor lasers K1 Laser noise K1 Time series analysis K1 Measurement by laser beam K1 Stochastic processes K1 Statistical distributions SP 55 OP 56 LK http://dx.doi.org/https://doi.org/10.1109/NUSOD59562.2023.10273522 DO https://doi.org/10.1109/NUSOD59562.2023.10273522 SF ELIB - SuUB Bremen
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