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Symmetries in Transmission Electron Microscopy images of se..:
, In:
2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
,
Maltsi, Anieza
;
Mielke, Alexander
;
Koprucki, Thomas
- p. 111-112 , 2023
Link:
https://doi.org/10.1109/NUSOD59562.2023.10273568
RT T1 <cTitle>2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)</cTitle>: T1 <Title>Symmetries in Transmission Electron Microscopy images of semiconductor nanostructures with strain</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10273568&Exemplar=1&LAN=DE A1 Maltsi, Anieza A1 Mielke, Alexander A1 Koprucki, Thomas YR 2023 SN 2158-3242 K1 Transmission electron microscopy K1 Microscopy K1 Semiconductor nanostructures K1 Optoelectronic devices K1 Numerical simulation K1 Strain SP 111 OP 112 LK http://dx.doi.org/https://doi.org/10.1109/NUSOD59562.2023.10273568 DO https://doi.org/10.1109/NUSOD59562.2023.10273568 SF ELIB - SuUB Bremen
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