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1 Ergebnisse
1
Extracting High Speed Refresh Current for DDR5 Module based..:
, In:
2023 International Symposium on Electromagnetic Compatibility – EMC Europe
,
Hong, Wonseok
;
Kim, Kwangho
;
Shin, Jaeyoung
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/EMCEurope57790.2023.10274218
RT T1 <cTitle>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</cTitle>: T1 <Title>Extracting High Speed Refresh Current for DDR5 Module based on Network Parameter Theory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10274218&Exemplar=1&LAN=DE A1 Hong, Wonseok A1 Kim, Kwangho A1 Shin, Jaeyoung A1 Sung, Rakjoo A1 Choi, Wooshin A1 Cho, Young-Chul A1 Choi, Jung-Hwan A1 Ko, Hyungjong YR 2023 SN 2325-0364 K1 Semiconductor device measurement K1 Voltage measurement K1 Impedance measurement K1 Current measurement K1 Simulation K1 Random access memory K1 Power systems K1 power integrity K1 chip-level current K1 chip power model K1 ABCD parameter K1 two-port network K1 power distribution network K1 dynamic random access memory SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/EMCEurope57790.2023.10274218 DO https://doi.org/10.1109/EMCEurope57790.2023.10274218 SF ELIB - SuUB Bremen
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