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1
Prevention of Sensor Disturbances caused by IEMI:
, In:
2023 International Symposium on Electromagnetic Compatibility – EMC Europe
,
Pahl, Arne
;
Rathjen, Kai-Uwe
;
Dickmann, Stefan
- p. 1-4 , 2023
Link:
https://doi.org/10.1109/EMCEurope57790.2023.10274307
RT T1 <cTitle>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</cTitle>: T1 <Title>Prevention of Sensor Disturbances caused by IEMI</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10274307&Exemplar=1&LAN=DE A1 Pahl, Arne A1 Rathjen, Kai-Uwe A1 Dickmann, Stefan YR 2023 SN 2325-0364 K1 Integrated circuits K1 Electromagnetic interference K1 Europe K1 Reliability theory K1 Electromagnetic compatibility K1 Topology K1 Circuit faults K1 sensors K1 intentional electromagnetic interference K1 IEMI K1 MEMS K1 I²C K1 EMC K1 I²C filter K1 sensor disturbance SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EMCEurope57790.2023.10274307 DO https://doi.org/10.1109/EMCEurope57790.2023.10274307 SF ELIB - SuUB Bremen
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