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1 Ergebnisse
1
Risk of EMI due to Necessary Modification in a Remote Micro..:
, In:
2023 International Symposium on Electromagnetic Compatibility – EMC Europe
,
Sulaeman, Ilman
;
Matthee, Alexander
;
Halidah, Hafsah
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/EMCEurope57790.2023.10274415
RT T1 <cTitle>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</cTitle>: T1 <Title>Risk of EMI due to Necessary Modification in a Remote Microgrid in Indonesia</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10274415&Exemplar=1&LAN=DE A1 Sulaeman, Ilman A1 Matthee, Alexander A1 Halidah, Hafsah A1 Akhmad, Kholid A1 Moonen, Niek A1 Popovic, Jelena A1 Leferink, Frank YR 2023 SN 2325-0364 K1 Electric potential K1 Voltage measurement K1 Grounding K1 Current measurement K1 Electromagnetic interference K1 Desalination K1 Microgrids K1 EMI K1 failure K1 measurement K1 ad-hoc modification K1 remote areas SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/EMCEurope57790.2023.10274415 DO https://doi.org/10.1109/EMCEurope57790.2023.10274415 SF ELIB - SuUB Bremen
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