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1 Ergebnisse
1
A Mixed De-Embedding Method for On-Wafer Differential Devic..:
, In:
2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)
,
Zhou, Pinhao
;
Shen, Guangxu
;
Feng, Wenjie
.. - p. 1-3 , 2023
Link:
https://doi.org/10.1109/ICMMT58241.2023.10277268
RT T1 <cTitle>2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)</cTitle>: T1 <Title>A Mixed De-Embedding Method for On-Wafer Differential Devices Using One Line Standard</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10277268&Exemplar=1&LAN=DE A1 Zhou, Pinhao A1 Shen, Guangxu A1 Feng, Wenjie A1 Xue, Quan A1 Che, Wenquan YR 2023 K1 Microwave integrated circuits K1 Millimeter wave technology K1 Microwave devices K1 Transformers K1 Feature extraction K1 Microwave FET integrated circuits K1 Standards K1 differential K1 de-embedding K1 measurement K1 cascade K1 lumped- element K1 transformer K1 GaAs SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICMMT58241.2023.10277268 DO https://doi.org/10.1109/ICMMT58241.2023.10277268 SF ELIB - SuUB Bremen
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