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1 Ergebnisse
1
Coupling Path Identification of Conducted EMI in a High-Vol..:
, In:
2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)
,
Xie, Yu-Ting
;
Zhang, Ling
;
Chen, Jun-Hui
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/ICMMT58241.2023.10277466
RT T1 <cTitle>2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)</cTitle>: T1 <Title>Coupling Path Identification of Conducted EMI in a High-Voltage Discharging Circuit Using Near-Field Scanning</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10277466&Exemplar=1&LAN=DE A1 Xie, Yu-Ting A1 Zhang, Ling A1 Chen, Jun-Hui A1 Li, Da A1 Yang, Zhen-Zhong A1 Li, Er-Ping YR 2023 K1 Couplings K1 Visualization K1 Microwave integrated circuits K1 Electromagnetic interference K1 Millimeter wave technology K1 High-voltage techniques K1 Microwave circuits SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICMMT58241.2023.10277466 DO https://doi.org/10.1109/ICMMT58241.2023.10277466 SF ELIB - SuUB Bremen
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