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1 Ergebnisse
1
Verification of Reference Impedance from Common On-Wafer Ca..:
, In:
2023 101st ARFTG Microwave Measurement Conference (ARFTG)
,
Nyssens, L.
;
Rack, M.
;
Tuyaerts, R.
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ARFTG57476.2023.10278758
RT T1 <cTitle>2023 101st ARFTG Microwave Measurement Conference (ARFTG)</cTitle>: T1 <Title>Verification of Reference Impedance from Common On-Wafer Calibrations on Commercial Calibration Substrates</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10278758&Exemplar=1&LAN=DE A1 Nyssens, L. A1 Rack, M. A1 Tuyaerts, R. A1 Lederer, D. A1 Raskin, J.-P. YR 2023 SN 2767-8776 K1 Microwave measurement K1 Systematics K1 Impedance measurement K1 Measurement uncertainty K1 Calibration K1 Frequency measurement K1 Impedance K1 on-wafer calibration K1 reference impedance K1 mTRL K1 LRRM K1 characteristic impedance K1 CPW line SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ARFTG57476.2023.10278758 DO https://doi.org/10.1109/ARFTG57476.2023.10278758 SF ELIB - SuUB Bremen
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