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A 3D FW-EM Simulation-Based PSOD Method for Characterizing ..:
, In:
2023 101st ARFTG Microwave Measurement Conference (ARFTG)
,
Shin, Yunsang
;
Nam, Sangwook
- p. 1-4 , 2023
Link:
https://doi.org/10.1109/ARFTG57476.2023.10279081
RT T1 <cTitle>2023 101st ARFTG Microwave Measurement Conference (ARFTG)</cTitle>: T1 <Title>A 3D FW-EM Simulation-Based PSOD Method for Characterizing On-Wafer Devices Compensating for Short Pattern Error</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10279081&Exemplar=1&LAN=DE A1 Shin, Yunsang A1 Nam, Sangwook YR 2023 SN 2767-8776 K1 Microwave measurement K1 Degradation K1 Solid modeling K1 Three-dimensional displays K1 Measurement uncertainty K1 Conductors K1 Broadband communication K1 Characterization K1 compensation technique K1 deembedding method K1 on-wafer K1 rectangular conductor SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ARFTG57476.2023.10279081 DO https://doi.org/10.1109/ARFTG57476.2023.10279081 SF ELIB - SuUB Bremen
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