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1 Ergebnisse
1
D-Band Characterization of a Commercial High-Resistivity Si..:
, In:
2023 101st ARFTG Microwave Measurement Conference (ARFTG)
,
Phung, Gia Ngoc
;
Koo, Hyunji
;
Cho, Chihyun
.. - p. 01-04 , 2023
Link:
https://doi.org/10.1109/ARFTG57476.2023.10279693
RT T1
2023 101st ARFTG Microwave Measurement Conference (ARFTG)
: T1
D-Band Characterization of a Commercial High-Resistivity Silicon Calibration Substrate
UL https://suche.suub.uni-bremen.de/peid=ieee-10279693&Exemplar=1&LAN=DE A1 Phung, Gia Ngoc A1 Koo, Hyunji A1 Cho, Chihyun A1 Kwon, Jae-Yong A1 Arz, Uwe YR 2023 SN 2767-8776 K1 Radio frequency K1 Microwave measurement K1 Silicon K1 Calibration K1 Scattering parameters K1 Probes K1 Electric fields K1 calibration K1 coplanar waveguides K1 on-wafer K1 probes K1 standards SP 01 OP 04 LK http://dx.doi.org/https://doi.org/10.1109/ARFTG57476.2023.10279693 DO https://doi.org/10.1109/ARFTG57476.2023.10279693 SF ELIB - SuUB Bremen
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