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1 Ergebnisse
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Novel ESD characterization method for bipolar devices using..:
, In:
2023 45th Annual EOS/ESD Symposium (EOS/ESD)
,
Magrini, Filippo
;
Stein, Bernhard
;
Ammer, Michael
. - p. 1-6 , 2023
Link:
https://doi.org/10.23919/EOS/ESD58195.2023.10287732
RT T1
2023 45th Annual EOS/ESD Symposium (EOS/ESD)
: T1
Novel ESD characterization method for bipolar devices using a combined TLP system with dynamic base bias
UL https://suche.suub.uni-bremen.de/peid=ieee-10287732&Exemplar=1&LAN=DE A1 Magrini, Filippo A1 Stein, Bernhard A1 Ammer, Michael A1 Cretu, Gabriel YR 2023 K1 Low voltage K1 Bipolar transistors K1 Modulation K1 High-voltage techniques K1 Conductivity K1 Electrostatic discharges K1 CMOS technology SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/EOS/ESD58195.2023.10287732 DO https://doi.org/10.23919/EOS/ESD58195.2023.10287732 SF ELIB - SuUB Bremen
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