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Understanding Temperature Dependence of ESD Reliability in ..:
, In:
2023 45th Annual EOS/ESD Symposium (EOS/ESD)
,
Munshi, Mohammad Ateeb
;
Ashraf Mir, Mehak
;
Malik, Rasik
... - p. 1-5 , 2023
Link:
https://doi.org/10.23919/EOS/ESD58195.2023.10287745
RT T1
2023 45th Annual EOS/ESD Symposium (EOS/ESD)
: T1
Understanding Temperature Dependence of ESD Reliability in AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-10287745&Exemplar=1&LAN=DE A1 Munshi, Mohammad Ateeb A1 Ashraf Mir, Mehak A1 Malik, Rasik A1 Joshi, Vipin A1 Roy Chaudhuri, Rajarshi A1 Khan, Zubear A1 Shrivastava, Mayank YR 2023 K1 Temperature dependence K1 Temperature K1 Semiconductor device reliability K1 Doping K1 HEMTs K1 Electrostatic discharges K1 Behavioral sciences SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.23919/EOS/ESD58195.2023.10287745 DO https://doi.org/10.23919/EOS/ESD58195.2023.10287745 SF ELIB - SuUB Bremen
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