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On the Survivability of a 28 - 32 GHz GaN Low Noise Amplifi..:
, In:
2023 18th European Microwave Integrated Circuits Conference (EuMIC)
,
Haque, Sanaul
;
Andrei, Cristina
;
Yazdani, Hossein
. - p. 17-20 , 2023
Link:
https://doi.org/10.23919/EuMIC58042.2023.10288728
RT T1
2023 18th European Microwave Integrated Circuits Conference (EuMIC)
: T1
On the Survivability of a 28 - 32 GHz GaN Low Noise Amplifier
UL https://suche.suub.uni-bremen.de/peid=ieee-10288728&Exemplar=1&LAN=DE A1 Haque, Sanaul A1 Andrei, Cristina A1 Yazdani, Hossein A1 Rudolph, Matthias YR 2023 K1 Resistors K1 Low-noise amplifiers K1 Noise figure K1 Silicon carbide K1 Bandwidth K1 Reflection coefficient K1 Transistors K1 low noise amplifier K1 GaN HEMT K1 Ka-band K1 mm-wave K1 robustness SP 17 OP 20 LK http://dx.doi.org/https://doi.org/10.23919/EuMIC58042.2023.10288728 DO https://doi.org/10.23919/EuMIC58042.2023.10288728 SF ELIB - SuUB Bremen
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