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1 Ergebnisse
1
Fully Integrated Built-In Self Test of Millimeter-Wave LNA ..:
, In:
2023 18th European Microwave Integrated Circuits Conference (EuMIC)
,
Simoncini, Guendalina
;
Palazzi, Valentina
;
Orecchini, Giulia
. - p. 374-377 , 2023
Link:
https://doi.org/10.23919/EuMIC58042.2023.10288783
RT T1 <cTitle>2023 18th European Microwave Integrated Circuits Conference (EuMIC)</cTitle>: T1 <Title>Fully Integrated Built-In Self Test of Millimeter-Wave LNA based on Avalanche Noise Diodes in 130 nm SiGe BiCMOS Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10288783&Exemplar=1&LAN=DE A1 Simoncini, Guendalina A1 Palazzi, Valentina A1 Orecchini, Giulia A1 Alimenti, Federico YR 2023 K1 Noise figure K1 Attenuators K1 Switches K1 Built-in self-test K1 Gain measurement K1 BiCMOS integrated circuits K1 Millimeter wave integrated circuits K1 Built-In Self Test (BIST) K1 Built-In Test Equipments (BITE) K1 Low-Noise Amplifier (LNA) K1 avalanche noise diodes K1 noise measurements K1 BiCMOS technology SP 374 OP 377 LK http://dx.doi.org/https://doi.org/10.23919/EuMIC58042.2023.10288783 DO https://doi.org/10.23919/EuMIC58042.2023.10288783 SF ELIB - SuUB Bremen
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