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1 Ergebnisse
1
Novel Fmax Enhancement Method for GaN HEMTs by Utilizing th..:
, In:
2023 18th European Microwave Integrated Circuits Conference (EuMIC)
,
Sakuno, Keiichi
;
Suematsu, Eiji
;
Hara, Shinji
- p. 42-45 , 2023
Link:
https://doi.org/10.23919/EuMIC58042.2023.10288860
RT T1
2023 18th European Microwave Integrated Circuits Conference (EuMIC)
: T1
Novel Fmax Enhancement Method for GaN HEMTs by Utilizing the Distributed Behavior of a Gate Finger
UL https://suche.suub.uni-bremen.de/peid=ieee-10288860&Exemplar=1&LAN=DE A1 Sakuno, Keiichi A1 Suematsu, Eiji A1 Hara, Shinji YR 2023 K1 Manufacturing processes K1 Fingers K1 Millimeter wave measurements K1 Prototypes K1 HEMTs K1 Logic gates K1 Transmission line measurements K1 transmission line K1 GaN K1 HEMT K1 RF CMOS K1 distributed effect K1 gate finger K1 5G K1 Beyond 5G K1 millimeter-wave SP 42 OP 45 LK http://dx.doi.org/https://doi.org/10.23919/EuMIC58042.2023.10288860 DO https://doi.org/10.23919/EuMIC58042.2023.10288860 SF ELIB - SuUB Bremen
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