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1 Ergebnisse
1
Impact of Off-State Stress on SiGe-channel p-FETs in 22nm F..:
, In:
2023 18th European Microwave Integrated Circuits Conference (EuMIC)
,
Huynh, Dang Khoa
;
Le, Quang Huy
;
Lehmann, Steffen
... - p. 173-176 , 2023
Link:
https://doi.org/10.23919/EuMIC58042.2023.10288886
RT T1 <cTitle>2023 18th European Microwave Integrated Circuits Conference (EuMIC)</cTitle>: T1 <Title>Impact of Off-State Stress on SiGe-channel p-FETs in 22nm FDSOI under Large-Signal Operation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10288886&Exemplar=1&LAN=DE A1 Huynh, Dang Khoa A1 Le, Quang Huy A1 Lehmann, Steffen A1 Zhao, Zhixing A1 Bossu, Germain A1 Arfaoui, Wafa A1 Kampfe, Thomas A1 Rudolph, Matthias YR 2023 K1 Degradation K1 Performance evaluation K1 Silicon-on-insulator K1 Power amplifiers K1 Modulation K1 Logic gates K1 Threshold voltage K1 hot-carrier K1 RF K1 reliability K1 large-signal K1 FDSOI K1 22FDX® SP 173 OP 176 LK http://dx.doi.org/https://doi.org/10.23919/EuMIC58042.2023.10288886 DO https://doi.org/10.23919/EuMIC58042.2023.10288886 SF ELIB - SuUB Bremen
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