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The role of gate leakage on surface-related current collaps..:
, In:
2023 18th European Microwave Integrated Circuits Conference (EuMIC)
,
Zervos, Christos
;
Beleniotis, Petros
;
Krause, Sascha
.. - p. 297-300 , 2023
Link:
https://doi.org/10.23919/EuMIC58042.2023.10289036
RT T1 <cTitle>2023 18th European Microwave Integrated Circuits Conference (EuMIC)</cTitle>: T1 <Title>The role of gate leakage on surface-related current collapse in AlGaN/GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10289036&Exemplar=1&LAN=DE A1 Zervos, Christos A1 Beleniotis, Petros A1 Krause, Sascha A1 Ritter, Dan A1 Rudolph, Matthias YR 2023 K1 Electron traps K1 Voltage measurement K1 Pulse measurements K1 Current measurement K1 Logic gates K1 HEMTs K1 Gate leakage K1 Gallium Nitride (GaN) K1 technology computer-aided design (TCAD) K1 surface trapping K1 current collapse SP 297 OP 300 LK http://dx.doi.org/https://doi.org/10.23919/EuMIC58042.2023.10289036 DO https://doi.org/10.23919/EuMIC58042.2023.10289036 SF ELIB - SuUB Bremen
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