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1 Ergebnisse
1
Capacitance RF Characterization and Modeling of 28 FD-SOI C..:
, In:
2023 18th European Microwave Integrated Circuits Conference (EuMIC)
,
Berlingard, Q.
;
Lugo-Alvarez, J.
;
Bawedin, M.
... - p. 37-40 , 2023
Link:
https://doi.org/10.23919/EuMIC58042.2023.10289100
RT T1 <cTitle>2023 18th European Microwave Integrated Circuits Conference (EuMIC)</cTitle>: T1 <Title>Capacitance RF Characterization and Modeling of 28 FD-SOI CMOS Transistors down to Cryogenic Temperature</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10289100&Exemplar=1&LAN=DE A1 Berlingard, Q. A1 Lugo-Alvarez, J. A1 Bawedin, M. A1 Mota-Frutuoso, T. A1 Durand, C. A1 Gloria, D. A1 Galy, P. A1 Casse, M. YR 2023 K1 Semiconductor device modeling K1 Microwave measurement K1 MOSFET K1 Logic gates K1 Capacitance K1 Frequency measurement K1 Electrical resistance measurement K1 FD-SOI K1 RF modeling K1 CryoCMOS K1 cryogenic RF measurement K1 Capacitance extraction SP 37 OP 40 LK http://dx.doi.org/https://doi.org/10.23919/EuMIC58042.2023.10289100 DO https://doi.org/10.23919/EuMIC58042.2023.10289100 SF ELIB - SuUB Bremen
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