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Reliability Studies of Fully Integrated CMOS Power Amplifie..:

, In: 2023 IEEE USNC-URSI Radio Science Meeting (Joint with AP-S Symposium),
Mitra, Dipankar ; Hamidi, Seyyed Babak ; Roy, Palash. - p. 111-112 , 2023
Link: https://doi.org/10.23919/USNC-URSI54200.2023.10289139