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1 Ergebnisse
1
GaN-on-Porous Silicon for RF Applications:
, In:
2023 53rd European Microwave Conference (EuMC)
,
Scheen, Gilles
;
Tuyaerts, Romain
;
Cardinael, Pieter
... - p. 842-845 , 2023
Link:
https://doi.org/10.23919/EuMC58039.2023.10290465
RT T1 <cTitle>2023 53rd European Microwave Conference (EuMC)</cTitle>: T1 <Title>GaN-on-Porous Silicon for RF Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10290465&Exemplar=1&LAN=DE A1 Scheen, Gilles A1 Tuyaerts, Romain A1 Cardinael, Pieter A1 Ekoga, Enrique A1 Aouadi, Khaled A1 Pavageau, Christophe A1 Rassekh, Amin A1 Nabet, Massinissa A1 Yadav, Sachin A1 Raskin, Jean-Pierre A1 Parvais, Bertrand A1 Emam, Mostafa YR 2023 K1 Radio frequency K1 Performance evaluation K1 Microwave technology K1 Costs K1 Linearity K1 Conductivity K1 Harmonic analysis K1 Effective dielectric permittivity K1 effective resistivity K1 harmonic distortion (HD) K1 RF and microwave losses K1 porous silicon (PSi) K1 GaN-on-Silicon (GaN-on-Si) technology K1 traprich (TR) K1 RF characterization K1 RF substrate SP 842 OP 845 LK http://dx.doi.org/https://doi.org/10.23919/EuMC58039.2023.10290465 DO https://doi.org/10.23919/EuMC58039.2023.10290465 SF ELIB - SuUB Bremen
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