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1 Ergebnisse
1
S-Parameters De-embedding at Cryogenic Temperature using On..:
, In:
2023 53rd European Microwave Conference (EuMC)
,
Mbeutcha, Marie
;
Schafer, Frank
;
Putz, Patrick
. - p. 612-615 , 2023
Link:
https://doi.org/10.23919/EuMC58039.2023.10290559
RT T1
2023 53rd European Microwave Conference (EuMC)
: T1
S-Parameters De-embedding at Cryogenic Temperature using One Reflect Standard
UL https://suche.suub.uni-bremen.de/peid=ieee-10290559&Exemplar=1&LAN=DE A1 Mbeutcha, Marie A1 Schafer, Frank A1 Putz, Patrick A1 Wieching, Gundolf YR 2023 K1 Microwave measurement K1 Phase measurement K1 Baluns K1 Fixtures K1 Measurement uncertainty K1 Surface mount technology K1 Cryogenics K1 measurement techniques K1 cryogenic AFR K1 1x reflect AFR K1 fixture removal K1 cryogenic S-parameters de-embedding K1 cryogenic measurements K1 balun characterization SP 612 OP 615 LK http://dx.doi.org/https://doi.org/10.23919/EuMC58039.2023.10290559 DO https://doi.org/10.23919/EuMC58039.2023.10290559 SF ELIB - SuUB Bremen
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