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1 Ergebnisse
1
Research on Reliability Analysis of Diodes in Energy Meters:
, In:
2023 IEEE 7th Information Technology and Mechatronics Engineering Conference (ITOEC)
,
Xiao, Ji
;
Zheng, Ke
;
Cheng, Yingying
... - p. 2258-2261 , 2023
Link:
https://doi.org/10.1109/ITOEC57671.2023.10291522
RT T1 <cTitle>2023 IEEE 7th Information Technology and Mechatronics Engineering Conference (ITOEC)</cTitle>: T1 <Title>Research on Reliability Analysis of Diodes in Energy Meters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10291522&Exemplar=1&LAN=DE A1 Xiao, Ji A1 Zheng, Ke A1 Cheng, Yingying A1 Zhang, Jiaming A1 Tan, Shishun A1 Liu, Han A1 Zhou, Feng A1 Xiao, Yuan YR 2023 SN 2693-289X K1 Meters K1 Performance evaluation K1 TV K1 Mechatronics K1 Voltage K1 Reliability engineering K1 Semiconductor diodes K1 Diode K1 Reliability analysis K1 Failure cause K1 Transient voltage suppressor SP 2258 OP 2261 LK http://dx.doi.org/https://doi.org/10.1109/ITOEC57671.2023.10291522 DO https://doi.org/10.1109/ITOEC57671.2023.10291522 SF ELIB - SuUB Bremen
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