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1 Ergebnisse
1
Automatic Test System for HPM Effect Injection Experiment:
, In:
2022 23rd International Vacuum Electronics Conference (IVEC)
,
Ma, Chunguang
;
Zhang, Mingwen
;
Gao, Yuanci
... - p. 306-307 , 2022
Link:
https://doi.org/10.1109/IVEC53421.2022.10292188
RT T1 <cTitle>2022 23rd International Vacuum Electronics Conference (IVEC)</cTitle>: T1 <Title>Automatic Test System for HPM Effect Injection Experiment</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10292188&Exemplar=1&LAN=DE A1 Ma, Chunguang A1 Zhang, Mingwen A1 Gao, Yuanci A1 Zhao, Junyu A1 Luo, Yong A1 Zhen, Qingqing YR 2022 K1 Visualization K1 Semiconductor devices K1 Electronic components K1 Microwave devices K1 Microwave circuits K1 Real-time systems K1 Vacuum electronics K1 high power microwave (HPM) K1 electromagnetic interference K1 injection experiments K1 automatic testing SP 306 OP 307 LK http://dx.doi.org/https://doi.org/10.1109/IVEC53421.2022.10292188 DO https://doi.org/10.1109/IVEC53421.2022.10292188 SF ELIB - SuUB Bremen
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